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Optical film / R2R

Optical film process inspection system

The production line needed stable high-speed detection of foreign material, scratches, bubbles and stains during optical-film transport.

Challenge

The production line needed stable high-speed detection of foreign material, scratches, bubbles and stains during optical-film transport.

Solution

UniEye applied UniScan-S line-scan inspection with defect maps, statistical reports and optional double-sided inspection and marking integration.

Outcome

The system expanded automated inspection coverage and supported defect traceability and process-quality data acquisition.

Implementation points

  • R2R surface-defect inspection
  • High-resolution camera and lighting optimization
  • Defect-position tracking and reporting
  • Configuration by line speed and film width

Feasibility for similar processes can be reviewed using sample images, defect types, line speed and inspection width.

Related products

UniEye will review feasibility, system configuration, optical/algorithm direction and factory integration scope.