Challenge
Transparent and multilayer film coating processes required continuous non-contact measurement of coating-layer thickness changes.
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Film coating / R2R metrology
Film coating OCT thickness metrology system
Transparent and multilayer film coating processes required continuous non-contact measurement of coating-layer thickness changes.
Solution
UniEye applied OCT/interferometry-based UniScan-T/ST metrology to acquire coating-thickness data and connect it with surface inspection.
Outcome
The system established a basis for managing in-process thickness deviation as quantitative data.
Implementation points
- OCT-based non-contact thickness measurement
- Multilayer and transmissive-material metrology
- Continuous process monitoring
- Inspection-data reporting
Feasibility for similar processes can be reviewed using sample images, defect types, line speed and inspection width.
Related products
UniEye will review feasibility, system configuration, optical/algorithm direction and factory integration scope.