01
Confirm process and defects
Start with the inspection target, defect types and line conditions.
Industrial Machine Vision Inspection & Metrology
AI vision inspection and precision metrology systems for R2R, MLCC, SMT, coating and film processes
UniEye reviews the inspection target, line speed, defect type, optical conditions and MES/PLC integration scope together to propose inspection systems that fit real production lines.
inspection result data
Line Scan · OCT · MES/PLC ready
R2R
200m/min
High-speed film and coating line inspection
Pattern
5㎛/px
High-resolution MLCC and printing-pattern inspection
Metrology
0.5–60㎛
OCT-based coating and film thickness measurement
Integration
MES/PLC
Inspection reports and production-data integration
Engagement Process
Industrial inspection starts with process conditions and samples, then moves into feasibility review and deployment planning.
01
Start with the inspection target, defect types and line conditions.
02
Provide normal/defect images plus speed, width and resolution requirements.
03
Select lighting, camera, sensor and judgement logic for the process.
04
Verify detectability and false/miss judgement risks with real data.
05
Define inspection UI, reporting, PLC/MES integration and deployment scope.
Solutions
Find the right UniEye solution by process and defect type, even before you know the product name.
R2R film/coating
Foreign material, scratches, pinholes, uncoated areas, edge defects
R2R film and coating inspection →
MLCC/printing pattern
Missing print, smear, margin, position deviation, OCR/OCV
MLCC and printing pattern inspection →
Thickness/optical metrology
Coating layers, multilayer film, transparent material thickness and VLT
Thickness and optical metrology →
SMT/PCB
Conformal coating, component presence/orientation, LED illumination
SMT and PCB inspection →
Special processes
Dimension, shape, alignment, rotary inspection, process monitoring
Custom vision and integration →
Products
Instead of listing every model, UniEye groups products by manufacturing challenge so buyers can quickly find the right inspection path.
UniScan-S · SP · F · FishEye · UniScan-E
R2R film and coating inspection family
UniScan-S · SP · F · FishEye · UniScan-E
Surface-defect and reference-position inspection family for foreign material, scratches, pinholes, uncoated areas, edge defects and position deviation on high-speed web lines.
View family →
UniScan-G · PX · PC · PS · StampEye
MLCC and printing pattern inspection family
UniScan-G · PX · PC · PS · StampEye
Product family for missing print, smear, splash, pinhole, margin, position deviation and OCR/OCV inspection in MLCC, film, packaging and marking processes.
View family →
UniScan-T · ST · TX · V
Thickness and optical metrology family
UniScan-T · ST · TX · V
Non-contact OCT, interferometry, confocal and laser metrology family for coating layers, multilayer films, transparent materials and transmittance.
View family →
UniCIM · UniS-A · UniS-L
SMT and PCB inspection family
UniCIM · UniS-A · UniS-L
Inspection family for conformal coating, component presence/orientation, LED illumination and Repair/SPC/MES workflows in electronics and PCB post-processes.
View family →
Motor Inspector · Die-cut Tape · PanelEye · UniView
Custom vision and integration family
Motor Inspector · Die-cut Tape · PanelEye · UniView
Project-specific product family for dimensional, shape, alignment, rotary, die-cutting and process-monitoring challenges beyond standard equipment.
View family →
Technology
Detailed technology pages explain the depth; the homepage keeps only the differentiation points buyers need first.
Inspection Architecture
Imaging → judgement/metrology → production data
01
High-speed imaging
Line-scan cameras, triggers, lighting control and image pipelines are configured around line speed.
View technology →
02
Optics and lighting design
Reflection, transmission, scattering and coaxial lighting are selected to maximize defect contrast.
View technology →
03
AI inspection algorithms
Rule-based judgement and deep-learning classification work together to detect, classify and reduce false calls.
View technology →
04
Metrology and line integration
OCT, 3D and thickness-metrology results connect to MES, PLC, SPC and reporting workflows.
View technology →
Success Story
Each story summarizes the process challenge, applied inspection approach and operational value.
MLCC / electronic components
The MLCC printing process required high-speed detection of repeated pattern defects such as missing print, smear, pinholes and margin abnormalities.
View story →
Optical film / R2R
The production line needed stable high-speed detection of foreign material, scratches, bubbles and stains during optical-film transport.
View story →
Medical patch / coating
Non-contact thickness monitoring was required where coating area and coating uniformity are critical.
View story →
Film coating / R2R metrology
Transparent and multilayer film coating processes required continuous non-contact measurement of coating-layer thickness changes.
View story →
Next Step
UniEye will review feasibility, system configuration, optical/algorithm direction and factory integration scope.
01
Send the target, line speed, defect types and sample images.
02
We review optics, lighting, algorithms, metrology and data integration scope.
03
After sample evaluation or PoC, we propose the system configuration and project scope.