Challenge
The MLCC printing process required high-speed detection of repeated pattern defects such as missing print, smear, pinholes and margin abnormalities.
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MLCC / electronic components
S-company MLCC printing inspection system
The MLCC printing process required high-speed detection of repeated pattern defects such as missing print, smear, pinholes and margin abnormalities.
Solution
UniEye applied UniScan-G/PX pattern-inspection technology, automatic pattern teaching, defect classification, result storage and reporting.
Outcome
The project automated MLCC printing-quality inspection and established a basis for tracking major defect types as process data.
Implementation points
- High-speed line-scan printing-pattern inspection
- Missing print, smear, pinhole and position-deviation detection
- PLC integration and result reporting
- Process-specific optics and algorithm tuning
Feasibility for similar processes can be reviewed using sample images, defect types, line speed and inspection width.
Related products
UniEye will review feasibility, system configuration, optical/algorithm direction and factory integration scope.