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Thickness Metrology

Coating and film thickness metrology

OCT and optical-interference based metrology for coating layers, transparent materials and micro thin films in the 0.5–60um range.

Interferometry, Confocal and Laser thickness metrology image

工艺挑战与UniEye方案

OCT and optical-interference based metrology for coating layers, transparent materials and micro thin films in the 0.5–60um range.

  • OCT/interferometry thin-film metrology
  • Confocal/Laser sensor selection
  • Non-contact high-speed inspection
  • Transparent, opaque, single-layer and multi-layer support

相关产品

thickness & hybrid inspectionUniScan-T / ST 产品图像

UniScan-T / ST

UniScan-T / ST 是 UniEye 的工业机器视觉检测/计量产品，可根据目标工艺配置缺陷检测、定量测量、报告和 PLC/MES 集成。

offline thickness measurementUniScan-TX 产品图像

UniScan-TX

UniScan-TX 是 UniEye 的工业机器视觉检测/计量产品，可根据目标工艺配置缺陷检测、定量测量、报告和 PLC/MES 集成。

VLT measuring systemUniScan-V 产品图像

UniScan-V

UniScan-V 是 UniEye 的工业机器视觉检测/计量产品，可根据目标工艺配置缺陷检测、定量测量、报告和 PLC/MES 集成。