Confirm process and defects
Start with the inspection target, defect types and line conditions.
Industrial Machine Vision Inspection & Metrology
Defect inspection and thickness metrology engineered for high-speed production lines.
AI vision inspection and precision metrology systems for R2R, MLCC, SMT, coating and film processes
UniEye reviews the inspection target, line speed, defect type, optical conditions and MES/PLC integration scope together to propose inspection systems that fit real production lines.
High-speed imagingOptics & lightingAI inspection algorithmsMetrology & line integration
Inspection FrameRUN
DEFECT · pinhole
inspection result data
Line Scan · OCT · MES/PLC ready
R2R
200m/min
High-speed film and coating line inspection
Pattern
5㎛/px
High-resolution MLCC and printing-pattern inspection
Metrology
0.5–60㎛
OCT-based coating and film thickness measurement
Integration
MES/PLC
Inspection reports and production-data integration
From sample review to line deployment
Industrial inspection starts with process conditions and samples, then moves into feasibility review and deployment planning.
Share samples and conditions
Provide normal/defect images plus speed, width and resolution requirements.
Review optics and algorithms
Select lighting, camera, sensor and judgement logic for the process.
Sample evaluation or PoC
Verify detectability and false/miss judgement risks with real data.
Propose system and integration
Define inspection UI, reporting, PLC/MES integration and deployment scope.
Solutions
UniEye solutions by manufacturing process
Find the right UniEye solution by process and defect type, even before you know the product name.
ProcessDefect · ChallengeSolution
R2R film/coating
Foreign material, scratches, pinholes, uncoated areas, edge defects
R2R film and coating inspection →
MLCC/printing pattern
Missing print, smear, margin, position deviation, OCR/OCV
MLCC and printing pattern inspection →
Thickness/optical metrology
Coating layers, multilayer film, transparent material thickness and VLT
Thickness and optical metrology →
SMT/PCB
Conformal coating, component presence/orientation, LED illumination
SMT and PCB inspection →
Special processes
Dimension, shape, alignment, rotary inspection, process monitoring
Custom vision and integration →
Connected Factory operations
Disconnected inspection, equipment and logistics status, alarms and Lot tracking
Nexfara ACS Domain →
Nexfara · Industrial Integration & Control
One flow from machine connectivity to execution and operations
EdgeOn turns legacy machines into standardized connected assets and Link bridges execution systems with business systems. For the ACS and WCS execution domains, choose Nexfara or integrate existing/vendor systems per project scope.
Explore the Nexfara solution →01
EdgeOn · Link connect and integrate
02
Open Execution: ACS/WCS Domain choice
03
Orchestrator · Monitor/Sim operations
04
Correlation ID based E2E traceability
Representative product families by solution
Instead of listing every model, UniEye groups products by manufacturing challenge so buyers can quickly find the right inspection path.
UniScan-S · SP · F · FishEye · UniScan-E
R2R film and coating inspection family
Surface-defect and reference-position inspection family for foreign material, scratches, pinholes, uncoated areas, edge defects and position deviation on high-speed web lines.
R2RFilmSurface defect
View family →
UniScan-G · PX · PC · PS · StampEye
MLCC and printing pattern inspection family
Product family for missing print, smear, splash, pinhole, margin, position deviation and OCR/OCV inspection in MLCC, film, packaging and marking processes.
MLCCPrintingPattern
View family →
UniScan-T · ST · TX · V
Thickness and optical metrology family
Non-contact OCT, interferometry, confocal and laser metrology family for coating layers, multilayer films, transparent materials and transmittance.
OCTThicknessOptical
View family →
UniCIM · UniS-A · UniS-L
SMT and PCB inspection family
Inspection family for conformal coating, component presence/orientation, LED illumination and Repair/SPC/MES workflows in electronics and PCB post-processes.
PCBCoatingMES/SPC
View family →
Motor Inspector · Die-cut Tape · PanelEye · UniView
Custom vision and integration family
Project-specific product family for dimensional, shape, alignment, rotary, die-cutting and process-monitoring challenges beyond standard equipment.
CustomAlignmentIntegration
View family →
EdgeOn · Link · Orchestrator · Monitor/Sim · UniACS
Nexfara industrial integration and control family
Industrial integration and control family combining legacy machine connectivity (EdgeOn), system integration (Link), optional orchestration and monitoring (Orchestrator·Monitor/Sim) and the ACS execution domain per project scope.
IntegrationEdgeOnACS
View family →
Detailed models are organized inside each solution page together with applicable process conditions.
Integrated design from optics to AI and factory integration
Detailed technology pages explain the depth; the homepage keeps only the differentiation points buyers need first.
Inspection Architecture
Imaging → judgement/metrology → production data
01
High-speed imaging
Line-scan cameras, triggers, lighting control and image pipelines are configured around line speed.
Line scanTriggerR2R
View technology →
02
Optics and lighting design
Reflection, transmission, scattering and coaxial lighting are selected to maximize defect contrast.
LensLightingContrast
View technology →
03
AI inspection algorithms
Rule-based judgement and deep-learning classification work together to detect, classify and reduce false calls.
Rule + AIClassificationReport
View technology →
04
Metrology and line integration
OCT, 3D and thickness-metrology results connect to MES, PLC, SPC and reporting workflows.
OCT/3DMES/PLCSPC
View technology →
Inspection systems proven in real manufacturing processes
Each story summarizes the process challenge, applied inspection approach and operational value.
MLCC / electronic components
S-company MLCC printing inspection system
The MLCC printing process required high-speed detection of repeated pattern defects such as missing print, smear, pinholes and margin abnormalities.
View story →
Optical film / R2R
Optical film process inspection system
The production line needed stable high-speed detection of foreign material, scratches, bubbles and stains during optical-film transport.
View story →
Medical patch / coating
Thickness metrology for medical patch coating
Non-contact thickness monitoring was required where coating area and coating uniformity are critical.
View story →
Film coating / R2R metrology
Film coating OCT thickness metrology system
Transparent and multilayer film coating processes required continuous non-contact measurement of coating-layer thickness changes.
View story →
Next Step
Tell us your inspection process and sample requirements.
UniEye will review feasibility, system configuration, optical/algorithm direction and factory integration scope.
01
Share process conditions
Send the target, line speed, defect types and sample images.
02
Review feasibility
We review optics, lighting, algorithms, metrology and data integration scope.
03
Proposal and PoC
After sample evaluation or PoC, we propose the system configuration and project scope.